Thank you for visiting my website. I am an early-career researcher specializing in the experimental characterization of functional oxide thin films. My work integrates complementary techniques, including electron microscopy, atomic force microscopy, X-ray diffraction, optical spectroscopy, ellipsometry, electrical transport measurements, ultrafast pump–probe methods, and synchrotron-based X-ray spectroscopy (XANES, EXAFS, and RIXS), to uncover structure–property relationships in complex oxides, with a focus on how intrinsic defects govern electronic structure and optical/transport behaviors.

Research Interests

• Semiconductors
• Functional oxide materials
• Defect physics
• Electronic structure
• Transient carrier dynamics
• Synchrotron-based spectroscopy

For more info

More info about me can be found at the links above.