Defective WO3-x Thin Films
- Quantified defect concentrations using EDXS, XPS, and Auger spectroscopy
- Developed ellipsometry models to resolve depth-dependent dielectric profiles
- Linked XANES/EXAFS results to oxidation states, local coordination, and oxygen vacancies
- Implemented Python-based NNMF workflows to extract hidden components from large RIXS datasets
- Established SEM/AFM protocols for nanoscale morphology and surface analysis
- Correlated XRD and Raman spectroscopy to identify amorphous-to-crystalline transitions
- Measured electrical transport, relating conductivity to defect chemistry
- Probed ultrafast carrier dynamics using pump–probe transient absorption spectroscopy